A negative differential conductivity due to recombination and impact ionization in semiconductors at low temperatures

The probability of impact ionization and the recombination time are known to increase monotonically with the electric field E. I show that at low temperatures both functions achieve a maximum and decrease in the electric field range where the emission of optical phonons with subsequent impurity scattering dominate. This nonmonotonicity results in three different types of N-shaped negative differential conductivity (n-ndc). The carrier concentration and the current decrease when E increases due to decreasing of the impact ionization probability for weakly compensated samples and of the recombination time for highly compensated samples. At the antithreshold electric-field impact ionization dies out, which results in a dramatic decrease of the current for intermediately compensated samples. This huge n-ndc could be used in a novel type of the Gunn diode. The essential increase of threshold electric field of impact ionization is also predicted, and the effect could enhance the efficiency of photodetectors.