TY - GEN
T1 - Zero-shot learning via class-conditioned deep generative models
AU - Wang, Wenlin
AU - Pu, Yunchen
AU - Verma, Vinay Kumar
AU - Fan, Kai
AU - Zhang, Yizhe
AU - Chen, Changyou
AU - Rai, Piyush
AU - Carin, Lawrence
N1 - Publisher Copyright:
Copyright © 2018, Association for the Advancement of Artificial Intelligence (www.aaai.org). All rights reserved.
PY - 2018
Y1 - 2018
N2 - We present a deep generative model for Zero-Shot Learning (ZSL). Unlike most existing methods for this problem, that represent each class as a point (via a semantic embedding), we represent each seen/unseen class using a class-specific latent-space distribution, conditioned on class attributes. We use these latent-space distributions as a prior for a supervised variational autoencoder (VAE), which also facilitates learning highly discriminative feature representations for the inputs. The entire framework is learned end-to-end using only the seen-class training data. At test time, the label for an unseen-class test input is the class that maximizes the VAE lower bound. We further extend the model to a (i) semi-supervised/transductive setting by leveraging unlabeled unseen-class data via an unsupervised learning module, and (ii) few-shot learning where we also have a small number of labeled inputs from the unseen classes. We compare our model with several state-of-the-art methods through a comprehensive set of experiments on a variety of benchmark data sets.
AB - We present a deep generative model for Zero-Shot Learning (ZSL). Unlike most existing methods for this problem, that represent each class as a point (via a semantic embedding), we represent each seen/unseen class using a class-specific latent-space distribution, conditioned on class attributes. We use these latent-space distributions as a prior for a supervised variational autoencoder (VAE), which also facilitates learning highly discriminative feature representations for the inputs. The entire framework is learned end-to-end using only the seen-class training data. At test time, the label for an unseen-class test input is the class that maximizes the VAE lower bound. We further extend the model to a (i) semi-supervised/transductive setting by leveraging unlabeled unseen-class data via an unsupervised learning module, and (ii) few-shot learning where we also have a small number of labeled inputs from the unseen classes. We compare our model with several state-of-the-art methods through a comprehensive set of experiments on a variety of benchmark data sets.
UR - https://www.scopus.com/pages/publications/85050913148
M3 - Conference contribution
AN - SCOPUS:85050913148
T3 - 32nd AAAI Conference on Artificial Intelligence, AAAI 2018
SP - 4211
EP - 4218
BT - 32nd AAAI Conference on Artificial Intelligence, AAAI 2018
PB - AAAI press
T2 - 32nd AAAI Conference on Artificial Intelligence, AAAI 2018
Y2 - 2 February 2018 through 7 February 2018
ER -