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X-ray study of atomic correlations epitaxial thin films

  • Q. Lu
  • , B. Bunker
  • , H. Luo
  • , A. Kropf
  • , K. Kemner
  • , J. Furdyna
  • University of Notre Dame

Research output: Contribution to journalArticlepeer-review

15 Scopus citations

Abstract

X-ray absorption fine-structure spectroscopy (XAFS) measurements have been performed at approximately 90 K to study the local structure of II-VI quaternary alloy (Formula presented)(Formula presented)(Formula presented)(Formula presented). Samples were grown by molecular beam epitaxy on (100) GaAs substrates, 4° miscut towards the (111)B direction with a ZnTe buffer layer. The XAFS data indicate that there are more Zn-Se and Cd-Te bonds in the alloy than expected for a random arrangement. The results imply the formation of high-strain local structure and indicate that electronic pairing energies dominate over strain energy. These results are similar to the earlier observation of interlayer switching in ZnTe/CdSe superlattices. The preference of Zn-Se and Cd-Te bonding also implies a tendency to spontaneously form a composition-modulated microstructure.

Original languageEnglish
Pages (from-to)9910-9914
Number of pages5
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume55
Issue number15
DOIs
StatePublished - 1997

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