Abstract
X-ray absorption fine-structure spectroscopy (XAFS) measurements have been performed at approximately 90 K to study the local structure of II-VI quaternary alloy (Formula presented)(Formula presented)(Formula presented)(Formula presented). Samples were grown by molecular beam epitaxy on (100) GaAs substrates, 4° miscut towards the (111)B direction with a ZnTe buffer layer. The XAFS data indicate that there are more Zn-Se and Cd-Te bonds in the alloy than expected for a random arrangement. The results imply the formation of high-strain local structure and indicate that electronic pairing energies dominate over strain energy. These results are similar to the earlier observation of interlayer switching in ZnTe/CdSe superlattices. The preference of Zn-Se and Cd-Te bonding also implies a tendency to spontaneously form a composition-modulated microstructure.
| Original language | English |
|---|---|
| Pages (from-to) | 9910-9914 |
| Number of pages | 5 |
| Journal | Physical Review B - Condensed Matter and Materials Physics |
| Volume | 55 |
| Issue number | 15 |
| DOIs | |
| State | Published - 1997 |
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