X-ray scattering and absorption studies of MnAs thin films grown by MBE on GaAs (001) substrates

MnAs thin films grown on GaAs (001) substrates by molecular beam epitaxy have been studied by grazing incidence x-ray scattering (GIXS), x-ray diffraction (XRD) and extended x-ray absorption fine structure (EXAFS). Microstructures in films prepared with different first-layer growth conditions (template effects) are compared in terms of the interfacial roughness, lattice constants, epilayer thickness, local environment surrounding the Mn atoms, coordination number, and local disorder. The template effects are found to cause significant differences in the local structures and crystallinity of MnAs epitaxial layers.