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X-ray microdiffraction analysis of mm-scale orientational correlations in Tl-1223 high-critical-current, high-temperature superconducting films

  • E. D. Specht
  • , A. Goyal
  • , D. M. Kroeger
  • , J. A. DeLuca
  • , J. E. Tkaczyk
  • , C. L. Briant
  • , J. A. Sutliff
  • Oak Ridge National Laboratory
  • General Electric

Research output: Contribution to journalArticlepeer-review

23 Scopus citations

Abstract

Tl1-yBa2Ca2Cu3Ox, y<0.2, (Tl-1223) films grown on polycrystalline yttria-stabilized zirconia (YSZ) substrates exhi bit a microstructure common in high-critical-current, high-temperature superconducting films. Plate-like grains are aligned with c-axes normal to the film; a- and b-axes are randomly oriented on a macroscopic scale. We describe X-ray pole-figure measurements from 0.1 mm regions of Tl-1223 films. For samples with the highest critical currents, the a-axes of the grains are locally aligned over distances up to 1 mm. Regions of higher critical current are associated with regions of high a-axis alignment.

Original languageEnglish
Pages (from-to)76-84
Number of pages9
JournalPhysica C: Superconductivity and its Applications
Volume226
Issue number1-2
DOIs
StatePublished - Jun 1 1994

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