Variable temperature scanning laser microscopy of wider width high temperature superconducting films

L. B. Wang; M. B. Price; C. Kwon; Q. X. Jia

doi:10.1109/TASC.2003.811908

Variable temperature scanning laser microscopy of wider width high temperature superconducting films

L. B. Wang
, M. B. Price
, C. Kwon
, Q. X. Jia

Department of Materials Design and Innovation

California State University Long Beach

Research output: Contribution to journal › Conference article › peer-review

3 Scopus citations

Abstract

We have investigated the spatial distribution of resistive properties in 2 mm wide and 10 mm long epitaxial superconducting films using a variable temperature scanning laser microscopy (VTSLM). This technique measures ac voltage of bolometric response created by a laser beam. We have observed the spatial nonuniformity of superconducting transition temperature in the resistive region, which has never been reported in samples wider than 300 μm using scanning laser techniques. This result is a significant step toward developing VTSLM for coated conductor diagnosis.

Original language	English
Pages (from-to)	2611-2613
Number of pages	3
Journal	IEEE Transactions on Applied Superconductivity
Volume	13
Issue number	2 III
DOIs	https://doi.org/10.1109/TASC.2003.811908
State	Published - Jun 2003
Event	2002 Applied Superconductivity Conference - Houston, TX, United States Duration: Aug 4 2002 → Aug 9 2002

Keywords

Epitaxial superconducting film
Spatial nonuniformity
Superconducting transition temperature
Variable temperature scanning laser microscopy

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10.1109/TASC.2003.811908

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title = "Variable temperature scanning laser microscopy of wider width high temperature superconducting films",

abstract = "We have investigated the spatial distribution of resistive properties in 2 mm wide and 10 mm long epitaxial superconducting films using a variable temperature scanning laser microscopy (VTSLM). This technique measures ac voltage of bolometric response created by a laser beam. We have observed the spatial nonuniformity of superconducting transition temperature in the resistive region, which has never been reported in samples wider than 300 μm using scanning laser techniques. This result is a significant step toward developing VTSLM for coated conductor diagnosis.",

keywords = "Epitaxial superconducting film, Spatial nonuniformity, Superconducting transition temperature, Variable temperature scanning laser microscopy",

author = "Wang, \{L. B.\} and Price, \{M. B.\} and C. Kwon and Jia, \{Q. X.\}",

year = "2003",

month = jun,

doi = "10.1109/TASC.2003.811908",

language = "English",

volume = "13",

pages = "2611--2613",

journal = "IEEE Transactions on Applied Superconductivity",

issn = "1051-8223",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "2 III",

note = "2002 Applied Superconductivity Conference ; Conference date: 04-08-2002 Through 09-08-2002",

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TY - JOUR

T1 - Variable temperature scanning laser microscopy of wider width high temperature superconducting films

AU - Wang, L. B.

AU - Price, M. B.

AU - Kwon, C.

AU - Jia, Q. X.

PY - 2003/6

Y1 - 2003/6

N2 - We have investigated the spatial distribution of resistive properties in 2 mm wide and 10 mm long epitaxial superconducting films using a variable temperature scanning laser microscopy (VTSLM). This technique measures ac voltage of bolometric response created by a laser beam. We have observed the spatial nonuniformity of superconducting transition temperature in the resistive region, which has never been reported in samples wider than 300 μm using scanning laser techniques. This result is a significant step toward developing VTSLM for coated conductor diagnosis.

AB - We have investigated the spatial distribution of resistive properties in 2 mm wide and 10 mm long epitaxial superconducting films using a variable temperature scanning laser microscopy (VTSLM). This technique measures ac voltage of bolometric response created by a laser beam. We have observed the spatial nonuniformity of superconducting transition temperature in the resistive region, which has never been reported in samples wider than 300 μm using scanning laser techniques. This result is a significant step toward developing VTSLM for coated conductor diagnosis.

KW - Epitaxial superconducting film

KW - Spatial nonuniformity

KW - Superconducting transition temperature

KW - Variable temperature scanning laser microscopy

UR - https://www.scopus.com/pages/publications/0041975814

U2 - 10.1109/TASC.2003.811908

DO - 10.1109/TASC.2003.811908

M3 - Conference article

AN - SCOPUS:0041975814

SN - 1051-8223

VL - 13

SP - 2611

EP - 2613

JO - IEEE Transactions on Applied Superconductivity

JF - IEEE Transactions on Applied Superconductivity

IS - 2 III

T2 - 2002 Applied Superconductivity Conference

Y2 - 4 August 2002 through 9 August 2002

ER -

Variable temperature scanning laser microscopy of wider width high temperature superconducting films

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Keywords

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