@inproceedings{2084a420886b4318827587c2a74b8d29,
title = "Use of performance path test to optimize yield",
abstract = "Performance path test provides an innovative alternative to PSRO performance screens and functional pattern test for manufacturing performance screening. The process window sigma associated with a desired screen point is used in a special timing run to create the expected delay for paths in the product. These expected delays are used to screen products. Products passing this test will meet requirements in client applications. Parts that fail will not meet product design assumptions and are not shipped. Performance path test avoids yield loss, false accept, and false reject problems associated with use of edge PSRO monitors.",
keywords = "Fmax, performance, timing, yield optimization",
author = "Bickford, \{Jeanne Paulette\} and Jinjun Xiong",
year = "2013",
doi = "10.1109/ASMC.2013.6552806",
language = "English",
isbn = "9781467350068",
series = "ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings",
pages = "206--211",
booktitle = "2013 24th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2013",
note = "2013 24th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2013 ; Conference date: 14-05-2013 Through 16-05-2013",
}