Skip to main navigation Skip to search Skip to main content

Unsupervised learning for defect identification in Yttria-Stabilized Zirconia from Atom Probe Tomography data

  • SUNY Buffalo

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

The properties of ceramic materials are strongly influenced by nanoscale defects such as oxygen vacancies and grain boundaries which drive phase transformations and affect functionality. Yttria-Stabilized Zirconia (YSZ), a widely used ceramic, is particularly sensitive to such defects at the atomic scale. In this work, to investigate these nanoscale features in YSZ we employ Atom Probe Tomography (APT) focusing on the Local Atomistic Environment (LAE) of yttrium atoms. We introduce a computational framework that constructs atomic neighborhoods using Voronoi tessellations, represents them as graphs, and quantifies their structure through customizable signature functions. These signature functions, when integrated with unsupervised learning techniques, enable the extraction of meaningful patterns and defect signatures from APT datasets. By representing LAEs as graph-based structures, our approach captures intricate local details of composition, coordination, and connectivity. This representation may be aid in indirectly identifying defects such as oxygen vacancies. Our analysis reveals significant differences in yttrium local atomistic environments of YSZ sample at grain boundaries compared to those within grains, with grain boundary regions showing fewer and less connected oxygen ions. Additionally, we distinguish between two distinct types of grain boundaries of YSZ sample based on their local atomic environments. Finally, we demonstrate that a graph based order parameter derived from the LAE enables the detection of subtle variations in oxygen ion coordination and connectivity features indicative of potential vacancies that are otherwise difficult to resolve. While applied here to YSZ, the framework is generalizable to other material systems. Its flexibility in designing material specific signature functions makes it a versatile tool for atomic scale characterization of various materials.

Original languageEnglish
Article number121768
JournalActa Materialia
Volume304
DOIs
StatePublished - Jan 1 2026

Keywords

  • Atom probe tomography
  • Ceramics
  • Machine learning

Fingerprint

Dive into the research topics of 'Unsupervised learning for defect identification in Yttria-Stabilized Zirconia from Atom Probe Tomography data'. Together they form a unique fingerprint.

Cite this