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UniHIST: A unified framework for image restoration with marginal histogram constraints

  • Xing Mei
  • , Weiming Dong
  • , Bao Gang Hu
  • , Siwei Lyu
  • State University of New York System
  • CAS - Institute of Automation

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

9 Scopus citations

Abstract

Marginal histograms provide valuable information for various computer vision problems. However, current image restoration methods do not fully exploit the potential of marginal histograms, in particular, their role as ensemble constraints on the marginal statistics of the restored image. In this paper, we introduce a new framework, UniHIST, to incorporate marginal histogram constraints into image restoration. The key idea of UniHIST is to minimize the discrepancy between the marginal histograms of the restored image and the reference histograms in pixel or gradient domains using the quadratic Wasserstein (W2) distance. The W2 distance can be computed directly from data without resorting to density estimation. It provides a differentiable metric between marginal histograms and allows easy integration with existing image restoration methods. We demonstrate the effectiveness of UniHIST through denoising of pattern images and non-blind deconvolution of natural images. We show that UniHIST enhances restoration performance and leads to visual and quantitative improvements over existing state-of-the-art methods.

Original languageEnglish
Title of host publicationIEEE Conference on Computer Vision and Pattern Recognition, CVPR 2015
PublisherIEEE Computer Society
Pages3753-3761
Number of pages9
ISBN (Electronic)9781467369640
DOIs
StatePublished - Oct 14 2015
EventIEEE Conference on Computer Vision and Pattern Recognition, CVPR 2015 - Boston, United States
Duration: Jun 7 2015Jun 12 2015

Publication series

NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Volume07-12-June-2015
ISSN (Print)1063-6919

Conference

ConferenceIEEE Conference on Computer Vision and Pattern Recognition, CVPR 2015
Country/TerritoryUnited States
CityBoston
Period06/7/1506/12/15

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