Two-photon optical-beam-induced current microscopy of indium gallium nitride light emitting diodes

Fu Jen Kao; Mao Kuo Huang; Yung Shun Wang; Sheng Lung Huang; Ming Kwei Lee; Chi Kuang Sun; Ping chin Cheng

doi:10.1117/12.390528

Two-photon optical-beam-induced current microscopy of indium gallium nitride light emitting diodes

Fu Jen Kao
, Mao Kuo Huang
, Yung Shun Wang
, Sheng Lung Huang
, Ming Kwei Lee
, Chi Kuang Sun
, Ping chin Cheng

Department of Electrical Engineering

National Sun Yat-sen University

Research output: Contribution to journal › Conference article › peer-review

4 Scopus citations

Abstract

In this study, epilayers of packaged indium gallium nitride light emitting diodes (LED's) are characterized by optical beam induced current (OBIC) and photoluminescence laser scanning microscopy through two-photon excitation. OBIC reveals spatial and electrical characteristics of LED's which can not be distinguished by photoluminescence. When compared with single-photon OBIC, two-photon OBIC imaging not only exhibits superior image quality but also reveals more clearly the characteristics of the epilayers that are being focused on. The uniformity of these LED's OBIC images can also be related to their light emitting efficiency.

Original language	English
Pages (from-to)	92-98
Number of pages	7
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	4082
DOIs	https://doi.org/10.1117/12.390528
State	Published - 2000
Event	Optical Sensing, Imaging, and Manipulation for Biological and Biomedical Applications - Taipei, Taiwan Duration: Jul 26 2000 → Jul 28 2000

Access to Document

10.1117/12.390528

Cite this

@article{0c28383d8b804ff39a181f32a123d1a0,

title = "Two-photon optical-beam-induced current microscopy of indium gallium nitride light emitting diodes",

abstract = "In this study, epilayers of packaged indium gallium nitride light emitting diodes (LED's) are characterized by optical beam induced current (OBIC) and photoluminescence laser scanning microscopy through two-photon excitation. OBIC reveals spatial and electrical characteristics of LED's which can not be distinguished by photoluminescence. When compared with single-photon OBIC, two-photon OBIC imaging not only exhibits superior image quality but also reveals more clearly the characteristics of the epilayers that are being focused on. The uniformity of these LED's OBIC images can also be related to their light emitting efficiency.",

author = "Kao, \{Fu Jen\} and Huang, \{Mao Kuo\} and Wang, \{Yung Shun\} and Huang, \{Sheng Lung\} and Lee, \{Ming Kwei\} and Sun, \{Chi Kuang\} and Cheng, \{Ping chin\}",

year = "2000",

doi = "10.1117/12.390528",

language = "English",

volume = "4082",

pages = "92--98",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Optical Sensing, Imaging, and Manipulation for Biological and Biomedical Applications ; Conference date: 26-07-2000 Through 28-07-2000",

}

TY - JOUR

T1 - Two-photon optical-beam-induced current microscopy of indium gallium nitride light emitting diodes

AU - Kao, Fu Jen

AU - Huang, Mao Kuo

AU - Wang, Yung Shun

AU - Huang, Sheng Lung

AU - Lee, Ming Kwei

AU - Sun, Chi Kuang

AU - Cheng, Ping chin

PY - 2000

Y1 - 2000

N2 - In this study, epilayers of packaged indium gallium nitride light emitting diodes (LED's) are characterized by optical beam induced current (OBIC) and photoluminescence laser scanning microscopy through two-photon excitation. OBIC reveals spatial and electrical characteristics of LED's which can not be distinguished by photoluminescence. When compared with single-photon OBIC, two-photon OBIC imaging not only exhibits superior image quality but also reveals more clearly the characteristics of the epilayers that are being focused on. The uniformity of these LED's OBIC images can also be related to their light emitting efficiency.

AB - In this study, epilayers of packaged indium gallium nitride light emitting diodes (LED's) are characterized by optical beam induced current (OBIC) and photoluminescence laser scanning microscopy through two-photon excitation. OBIC reveals spatial and electrical characteristics of LED's which can not be distinguished by photoluminescence. When compared with single-photon OBIC, two-photon OBIC imaging not only exhibits superior image quality but also reveals more clearly the characteristics of the epilayers that are being focused on. The uniformity of these LED's OBIC images can also be related to their light emitting efficiency.

UR - https://www.scopus.com/pages/publications/0033684284

U2 - 10.1117/12.390528

DO - 10.1117/12.390528

M3 - Conference article

AN - SCOPUS:0033684284

SN - 0277-786X

VL - 4082

SP - 92

EP - 98

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Optical Sensing, Imaging, and Manipulation for Biological and Biomedical Applications

Y2 - 26 July 2000 through 28 July 2000

ER -

Two-photon optical-beam-induced current microscopy of indium gallium nitride light emitting diodes

Abstract

Access to Document

Other files and links

Fingerprint

Cite this