Twin boundaries in C54-TiSi2

Krishna Rajan

doi:10.1007/BF02646978

Twin boundaries in C54-TiSi₂

Krishna Rajan

Department of Materials Design and Innovation

Research output: Contribution to journal › Article › peer-review

7 Scopus citations

Abstract

A large-grained microstructure of C54-TiSi₂ has been produced by rapid thermal annealing of Ti/Si thin film couples. Unlike the metastable C49-TiSi₂ phase, which is heavily faulted, the C54-TiSi₂ is relatively fault-free. We have, however, observed for the first time the presence of twins in C54-TiSi₂. The presence of twinning is explained by an atomic model for polytypism in this structure. The faceting of twin boundaries and the dissociation of grain boundaries have also been observed for the first time in C54-TiSi₂. It is proposed that the latter observations are related to boundary migration.

Original language	English
Pages (from-to)	2317-2322
Number of pages	6
Journal	Metallurgical Transactions A
Volume	21
Issue number	9
DOIs	https://doi.org/10.1007/BF02646978
State	Published - Sep 1990

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title = "Twin boundaries in C54-TiSi2",

abstract = "A large-grained microstructure of C54-TiSi2 has been produced by rapid thermal annealing of Ti/Si thin film couples. Unlike the metastable C49-TiSi2 phase, which is heavily faulted, the C54-TiSi2 is relatively fault-free. We have, however, observed for the first time the presence of twins in C54-TiSi2. The presence of twinning is explained by an atomic model for polytypism in this structure. The faceting of twin boundaries and the dissociation of grain boundaries have also been observed for the first time in C54-TiSi2. It is proposed that the latter observations are related to boundary migration.",

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N2 - A large-grained microstructure of C54-TiSi2 has been produced by rapid thermal annealing of Ti/Si thin film couples. Unlike the metastable C49-TiSi2 phase, which is heavily faulted, the C54-TiSi2 is relatively fault-free. We have, however, observed for the first time the presence of twins in C54-TiSi2. The presence of twinning is explained by an atomic model for polytypism in this structure. The faceting of twin boundaries and the dissociation of grain boundaries have also been observed for the first time in C54-TiSi2. It is proposed that the latter observations are related to boundary migration.

AB - A large-grained microstructure of C54-TiSi2 has been produced by rapid thermal annealing of Ti/Si thin film couples. Unlike the metastable C49-TiSi2 phase, which is heavily faulted, the C54-TiSi2 is relatively fault-free. We have, however, observed for the first time the presence of twins in C54-TiSi2. The presence of twinning is explained by an atomic model for polytypism in this structure. The faceting of twin boundaries and the dissociation of grain boundaries have also been observed for the first time in C54-TiSi2. It is proposed that the latter observations are related to boundary migration.

UR - https://www.scopus.com/pages/publications/0025486830

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DO - 10.1007/BF02646978

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VL - 21

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JO - Metallurgical Transactions A

JF - Metallurgical Transactions A

IS - 9

ER -

Twin boundaries in C54-TiSi₂

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