Abstract
Several configurations of Ag-sheathed Bi-2212 tape joints were investigated. These included simple lap joints and bridge joints (bridging two tapes with a third tape). The green conductors in these configurations were annealed using a partial-melt-growth process. The transport properties of these joints were measured by the four point d.c. method. Results indicate that the critical temperature decreased 7 K, while the critical current decreased by 30% for an overlap of ~ 2 cm on a ~ 0.9 cm wide × 60 μm thick tape. This degradation in the transport properties was compensated for by increasing the overlap region, so as to reduce the degradation in the transport properties, particularly Ic, based on 1 MU;m/cm criterion. Results of this investigation will be discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 15-19 |
| Number of pages | 5 |
| Journal | Applied Superconductivity |
| Volume | 3 |
| Issue number | 1-3 |
| DOIs | |
| State | Published - 1995 |
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