Abstract
Transmission measurements of the extended X-ray absorption fine structure above the oxygen K-edge have been made by using a new scintillation detection technique. The absorption spectrum is in close resemblance with the total electron yield spectrum recorded at the same time. This new technique is of interest for studies of soft X-ray absorption spectroscopy for thin films of solid materials.
| Original language | English |
|---|---|
| Pages (from-to) | 283-288 |
| Number of pages | 6 |
| Journal | Physics Letters A |
| Volume | 113 |
| Issue number | 5 |
| DOIs | |
| State | Published - Dec 23 1985 |
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