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Transmission measurements of soft X-ray absorption fine structure in solids by a new scintillation technique

  • Bing Xin Yang
  • , Yi Han Kao
  • , Janos Kirz
  • , Chang Xin Gu
  • , R. N. Bhargava
  • , D. A. Cammack
  • , R. J. Dalby
  • Stony Brook University
  • Koninklijke Philips N.V.

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Transmission measurements of the extended X-ray absorption fine structure above the oxygen K-edge have been made by using a new scintillation detection technique. The absorption spectrum is in close resemblance with the total electron yield spectrum recorded at the same time. This new technique is of interest for studies of soft X-ray absorption spectroscopy for thin films of solid materials.

Original languageEnglish
Pages (from-to)283-288
Number of pages6
JournalPhysics Letters A
Volume113
Issue number5
DOIs
StatePublished - Dec 23 1985

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