Transformer fault protection for low impedance faults

T. R. Eckstein; J. L. Zirnheld; K. M. Burke; W. J. Sarjeant

Transformer fault protection for low impedance faults

T. R. Eckstein
, J. L. Zirnheld
, K. M. Burke
, W. J. Sarjeant

Department of Electrical Engineering

SUNY Buffalo

Research output: Contribution to journal › Conference article › peer-review

Abstract

Precision measurements of insulation quality demands minimizing damage during test-to-breakdown. A fault tolerant insertion system has been developed for this application. A current limiting model for this system design that protects the high current insertion transformer from sustaining irreparable damage is presented. This also includes the ability to limit the current flowing through the variac brushes.

Original language	English
Pages (from-to)	255-258
Number of pages	4
Journal	IEEE Conference Record of Power Modulator Symposium
State	Published - 1998
Event	Proceedings of the 1998 23rd International Power Modulator Symposium - Rancho Mirage, CA, USA Duration: Jun 21 1998 → Jun 25 1998

Cite this

@article{98322f6eeb844b9faf3ba826d6fcb06d,

title = "Transformer fault protection for low impedance faults",

abstract = "Precision measurements of insulation quality demands minimizing damage during test-to-breakdown. A fault tolerant insertion system has been developed for this application. A current limiting model for this system design that protects the high current insertion transformer from sustaining irreparable damage is presented. This also includes the ability to limit the current flowing through the variac brushes.",

author = "Eckstein, \{T. R.\} and Zirnheld, \{J. L.\} and Burke, \{K. M.\} and Sarjeant, \{W. J.\}",

year = "1998",

language = "English",

pages = "255--258",

journal = "IEEE Conference Record of Power Modulator Symposium",

issn = "1076-8467",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "Proceedings of the 1998 23rd International Power Modulator Symposium ; Conference date: 21-06-1998 Through 25-06-1998",

}

TY - JOUR

T1 - Transformer fault protection for low impedance faults

AU - Eckstein, T. R.

AU - Zirnheld, J. L.

AU - Burke, K. M.

AU - Sarjeant, W. J.

PY - 1998

Y1 - 1998

N2 - Precision measurements of insulation quality demands minimizing damage during test-to-breakdown. A fault tolerant insertion system has been developed for this application. A current limiting model for this system design that protects the high current insertion transformer from sustaining irreparable damage is presented. This also includes the ability to limit the current flowing through the variac brushes.

AB - Precision measurements of insulation quality demands minimizing damage during test-to-breakdown. A fault tolerant insertion system has been developed for this application. A current limiting model for this system design that protects the high current insertion transformer from sustaining irreparable damage is presented. This also includes the ability to limit the current flowing through the variac brushes.

UR - https://www.scopus.com/pages/publications/0032279694

M3 - Conference article

AN - SCOPUS:0032279694

SN - 1076-8467

SP - 255

EP - 258

JO - IEEE Conference Record of Power Modulator Symposium

JF - IEEE Conference Record of Power Modulator Symposium

T2 - Proceedings of the 1998 23rd International Power Modulator Symposium

Y2 - 21 June 1998 through 25 June 1998

ER -

Transformer fault protection for low impedance faults

Abstract

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