@inproceedings{16441b3eaf4a4f438221e50934151a62,
title = "Time slot specification based approach to analog fault diagnosis using built-in current sensors and test point insertion",
abstract = "Testing and diagnosis of analog circuits continues to be a hard task for test engineers and efficient test methodologies to tackle these problems are needed. This paper proposes a novel analog test method using time slot specification (TSS) based built-in current sensors. A technique for location of a fault site and fault type, based on TSS, is presented. The proposed built-in current sense and decision module (BSDM), in association with TSS analysis, has high testability and good fault coverage, and a capability to diagnose catastrophic faults and parametric faults in analog circuits. The digital output of the BSDM can be easily combined with built-in digital test modules for mixed-signal IC testing. The general heuristics for test point placement are also described.",
keywords = "Fault diagnosis, Strontium, Testing",
author = "S. Upadhyaya and Lee, \{Jae Min\} and P. Nair",
note = "Publisher Copyright: {\textcopyright} 2002 IEEE.; 11th Asian Test Symposium, ATS 2002 ; Conference date: 18-11-2002 Through 20-11-2002",
year = "2002",
doi = "10.1109/ATS.2002.1181749",
language = "English",
series = "Proceedings of the Asian Test Symposium",
publisher = "IEEE Computer Society",
pages = "429--434",
booktitle = "Proceedings of the 11th Asian Test Symposium, ATS 2002",
address = "United States",
}