Skip to main navigation Skip to search Skip to main content

THz Transmission through Submillimeter Apertures

  • SUNY Buffalo
  • LongWave Photonics

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Terahertz near-field microspectroscopy is emerging as an essential tool for characterization of novel materials and biomolecules. It is important to ensure the near field geometry used does not introduce spectral artifacts. For example, many scanning techniques can be strongly influenced by the interaction between the scattering tip and the sample. Here we examine the spectroscopic effects of a 200\ \mu\mathrm{m} diameter aperture for THz near-field measurements. We use HFSS to model free-space transmission through samples with resonant absorbance as a function of sample thickness, lateral sample width, and aperture diameter. We examine the transmitted power and spectral fidelity for coupling of transmitted THz light onto a detector. These studies inform corrective post-measurement analysis algorithms and design of near-field detection systems.

Original languageEnglish
Title of host publication2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020
PublisherIEEE Computer Society
Pages308-309
Number of pages2
ISBN (Electronic)9781728166209
DOIs
StatePublished - Nov 8 2020
Event45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020 - Virtual, Buffalo, United States
Duration: Nov 8 2020Nov 13 2020

Publication series

NameInternational Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
Volume2020-November
ISSN (Print)2162-2027
ISSN (Electronic)2162-2035

Conference

Conference45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020
Country/TerritoryUnited States
CityVirtual, Buffalo
Period11/8/2011/13/20

Fingerprint

Dive into the research topics of 'THz Transmission through Submillimeter Apertures'. Together they form a unique fingerprint.

Cite this