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THz studies of optoelectronic chalcogenide perovskite thin films

  • SUNY Buffalo

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We measure THz (10-90 cm-1, 1-11meV) transmittance through chalcogenide perovskite thin films in the 80-295 K temperature range. SrHfS3, BaZrS3, and BaZrS3 films were deposited on sapphire substrates using magnetron sputtering. The transmittance data provide the complex refractive index of the films. We observe Drude conductivity as well as several phonon features that are temperature dependent. The THz behavior provides new information on the electronic and lattice structure of these new materials.

Original languageEnglish
Title of host publication2024 49th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2024
PublisherIEEE Computer Society
ISBN (Electronic)9798350370324
DOIs
StatePublished - 2024
Event49th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2024 - Perth, Australia
Duration: Sep 1 2024Sep 6 2024

Publication series

NameInternational Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
ISSN (Print)2162-2027
ISSN (Electronic)2162-2035

Conference

Conference49th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2024
Country/TerritoryAustralia
CityPerth
Period09/1/2409/6/24

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