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Thin-film evolution equation for a strained solid film on a deformable substrate: Numerical steady states

  • Rochester Institute of Technology

Research output: Contribution to journalArticlepeer-review

19 Scopus citations

Abstract

We consider the nonlinear behavior of the thin-film evolution equation for a strained solid film on a substrate. The evolution equation describes morphological changes to the film by surface diffusion in response to elastic energy, surface energy, and wetting energy. Due to the thin-film approximation, the elastic response of the film is determined analytically, resulting in a self-contained evolution equation which does not require separate numerical solution of the full three-dimensional elasticity problem. Using a pseudospectral predictor-corrector method we numerically determine the family of steady state solutions to this evolution equation which correspond to quantum dot and quantum ridge morphologies.

Original languageEnglish
Article number073503
JournalJournal of Applied Physics
Volume102
Issue number7
DOIs
StatePublished - 2007

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