The combination of XPS and mass spectrometry for structural characterization of polyaniline

Anthony R. Dolan; Daniel J. Higbee; Troy D. Wood

The combination of XPS and mass spectrometry for structural characterization of polyaniline

Anthony R. Dolan
, Daniel J. Higbee
, Troy D. Wood

Chemistry

SUNY Buffalo

Research output: Contribution to conference › Paper › peer-review

Abstract

Mass spectrometry (MS) in combination with XPS were used for the structural characterization of polyaniline, a conducting polymer. XPS identified the various elements that comprised the polymer, along with their relative percentages. To prepare the samples of XPS, a thin film of polyaniline was applied onto a piece of borosilicate slide. The results show that the material which is analyzed is comprised of nitrogen, carbon and oxygen and the binding energy of nitrogen is associated with amine, imine and cationic nitrogens.

Original language	English
Pages	727-728
Number of pages	2
State	Published - 2002
Event	Proceedings - 50th ASMS Conference on Mass Spectrometry and Allied Topics - Orlando, FL, United States Duration: Jun 2 2002 → Jun 6 2002

Conference

Conference	Proceedings - 50th ASMS Conference on Mass Spectrometry and Allied Topics
Country/Territory	United States
City	Orlando, FL
Period	06/2/02 → 06/6/02

Cite this

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title = "The combination of XPS and mass spectrometry for structural characterization of polyaniline",

abstract = "Mass spectrometry (MS) in combination with XPS were used for the structural characterization of polyaniline, a conducting polymer. XPS identified the various elements that comprised the polymer, along with their relative percentages. To prepare the samples of XPS, a thin film of polyaniline was applied onto a piece of borosilicate slide. The results show that the material which is analyzed is comprised of nitrogen, carbon and oxygen and the binding energy of nitrogen is associated with amine, imine and cationic nitrogens.",

author = "Dolan, \{Anthony R.\} and Higbee, \{Daniel J.\} and Wood, \{Troy D.\}",

year = "2002",

language = "English",

pages = "727--728",

note = "Proceedings - 50th ASMS Conference on Mass Spectrometry and Allied Topics ; Conference date: 02-06-2002 Through 06-06-2002",

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TY - CONF

T1 - The combination of XPS and mass spectrometry for structural characterization of polyaniline

AU - Dolan, Anthony R.

AU - Higbee, Daniel J.

AU - Wood, Troy D.

PY - 2002

Y1 - 2002

N2 - Mass spectrometry (MS) in combination with XPS were used for the structural characterization of polyaniline, a conducting polymer. XPS identified the various elements that comprised the polymer, along with their relative percentages. To prepare the samples of XPS, a thin film of polyaniline was applied onto a piece of borosilicate slide. The results show that the material which is analyzed is comprised of nitrogen, carbon and oxygen and the binding energy of nitrogen is associated with amine, imine and cationic nitrogens.

AB - Mass spectrometry (MS) in combination with XPS were used for the structural characterization of polyaniline, a conducting polymer. XPS identified the various elements that comprised the polymer, along with their relative percentages. To prepare the samples of XPS, a thin film of polyaniline was applied onto a piece of borosilicate slide. The results show that the material which is analyzed is comprised of nitrogen, carbon and oxygen and the binding energy of nitrogen is associated with amine, imine and cationic nitrogens.

UR - https://www.scopus.com/pages/publications/2442660536

M3 - Paper

AN - SCOPUS:2442660536

SP - 727

EP - 728

T2 - Proceedings - 50th ASMS Conference on Mass Spectrometry and Allied Topics

Y2 - 2 June 2002 through 6 June 2002

ER -

The combination of XPS and mass spectrometry for structural characterization of polyaniline

Abstract

Conference

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