@inproceedings{8d601b0e49564cd68ba8d5b08ca39f95,
title = "Test scheduling for system-on-a-chip using test resource grouping",
abstract = "Test scheduling has been known to be one of the efficient techniques for reducing testing time of Ss'stem-on-a-Chip(SoC). In this paper, a heuristic algorithm, in which test resources are grouped and arranged based on the size of product of power dissipation and test time of each core together with total power consumption in core-based SoC is proposed. We select test resource groups which have maximum power consumption but do not exceed the constrained power consumption and make the testing time slot of resources aligned at the initial position to minimize the idling test time of test resources.",
author = "Park, \{Jin Sung\} and Lee, \{Jae Min\} and Shambhu Upadhyaya",
note = "Publisher Copyright: {\textcopyright} 2003 IEEE; 5th International Conference on ASIC, ASICON 2003 ; Conference date: 21-10-2003 Through 24-10-2003",
year = "2003",
doi = "10.1109/ICASIC.2003.1277421",
language = "English",
series = "IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1167--1170",
editor = "Ting-Ao Tang and Wenhong Li and Huihua Yu",
booktitle = "ASICON 2003 - 2003 5th International Conference on ASIC, Proceedings",
address = "United States",
}