Abstract
Shunt resistance in surface passivated Si solar cells has been experimentally shown to be temperature dependent with a maximum value of 2×107 Ω cm2. Mechanisms responsible for shunt resistance are identified as a combination of multistep tunneling and thermal trapping-detrapping of carriers through the defect states in the space-charge region.
| Original language | English |
|---|---|
| Pages (from-to) | 38-40 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 49 |
| Issue number | 1 |
| DOIs | |
| State | Published - 1986 |
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