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Temperature dependence of shunt resistance in photovoltaic devices

  • SUNY Buffalo

Research output: Contribution to journalArticlepeer-review

39 Scopus citations

Abstract

Shunt resistance in surface passivated Si solar cells has been experimentally shown to be temperature dependent with a maximum value of 2×107 Ω cm2. Mechanisms responsible for shunt resistance are identified as a combination of multistep tunneling and thermal trapping-detrapping of carriers through the defect states in the space-charge region.

Original languageEnglish
Pages (from-to)38-40
Number of pages3
JournalApplied Physics Letters
Volume49
Issue number1
DOIs
StatePublished - 1986

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