TEM characterization of self-assembled magnetic nanowires

X. Zhao; Y. Liu; M. Zheng; Z. Hao; S. Bandyopadhay; D. Sellmyer

doi:10.1017/s1431927602103461

TEM characterization of self-assembled magnetic nanowires

X. Zhao
, Y. Liu
, M. Zheng
, Z. Hao
, S. Bandyopadhay
, D. Sellmyer

Physics

University of Michigan, Ann Arbor
University of Nebraska-Lincoln

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1368-1369
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	8
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/s1431927602103461
State	Published - 2002

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title = "TEM characterization of self-assembled magnetic nanowires",

author = "X. Zhao and Y. Liu and M. Zheng and Z. Hao and S. Bandyopadhay and D. Sellmyer",

year = "2002",

doi = "10.1017/s1431927602103461",

language = "English",

volume = "8",

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journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "SUPPL. 2",

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TY - JOUR

T1 - TEM characterization of self-assembled magnetic nanowires

AU - Zhao, X.

AU - Liu, Y.

AU - Zheng, M.

AU - Hao, Z.

AU - Bandyopadhay, S.

AU - Sellmyer, D.

PY - 2002

Y1 - 2002

UR - https://www.scopus.com/pages/publications/0036409102

U2 - 10.1017/s1431927602103461

DO - 10.1017/s1431927602103461

M3 - Article

AN - SCOPUS:0036409102

SN - 1431-9276

VL - 8

SP - 1368

EP - 1369

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

TEM characterization of self-assembled magnetic nanowires

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