Abstract
The strong systematic dependence of the in-field critical current density (J c) on rare earth (RE) ion size variance in mixed RE-123 films was investigated. The average ionic radius was kept constant to remove the effect of the differing ionic radii. It was found that for a constant average RE ionic radius, there was a systematic dependence of the in-field J c on the RE ion size variance with a small, but nonzero, variance being vaccum. It was also found that at 0.2T, samples with a non-zero variance on single crystal and IBAD-MgO substrates had higher J c than YBCO by a factor of 2.
| Original language | English |
|---|---|
| Pages (from-to) | 5329-5331 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 84 |
| Issue number | 26 |
| DOIs | |
| State | Published - Jun 28 2004 |
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