Abstract
Multitechnique surface characterization of plasma and chemically modified poly(methyl methacrylate) (PMMA) is reported using Low Energy Ion Scattering Spectrometry (LEIS or ISS) and angular‐dependent X‐Ray Photoelectron Spectroscopy (XPS or ESCA). A complete picture of the depth, extent, and mechanism of modifications developed. ISS yields results, which especially complement ESCA because of the sensitivity to functional group arrangement due to shadowing and shielding of atoms in the topmost layer.
| Original language | English |
|---|---|
| Pages (from-to) | 939-944 |
| Number of pages | 6 |
| Journal | Polymer Engineering and Science |
| Volume | 27 |
| Issue number | 13 |
| DOIs | |
| State | Published - Jul 1987 |
Fingerprint
Dive into the research topics of 'Surface spectroscopic studies of poly(methyl methacrylate) (PMMA) and modified PMMA surfaces'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver