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Surface spectroscopic studies of poly(methyl methacrylate) (PMMA) and modified PMMA surfaces

  • PerkinElmer, Inc.
  • SUNY Buffalo
  • Allied Chemical Corporation

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

Multitechnique surface characterization of plasma and chemically modified poly(methyl methacrylate) (PMMA) is reported using Low Energy Ion Scattering Spectrometry (LEIS or ISS) and angular‐dependent X‐Ray Photoelectron Spectroscopy (XPS or ESCA). A complete picture of the depth, extent, and mechanism of modifications developed. ISS yields results, which especially complement ESCA because of the sensitivity to functional group arrangement due to shadowing and shielding of atoms in the topmost layer.

Original languageEnglish
Pages (from-to)939-944
Number of pages6
JournalPolymer Engineering and Science
Volume27
Issue number13
DOIs
StatePublished - Jul 1987

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