Abstract
The surface region of a series of poly(tetramethyl-p-silphenylenesiloxane) poly(dimethylsiloxane) block copolymers was investigated using X-ray photoelectron spectroscopy and attenuated total reflectance Fourier transform infra-red spectroscopy. Analysis of the results shows the surface region to be equivalent to the bulk composition for all but one sample. This indicates that for all but the most crystalline samples the surface region comprises a relatively thick layer of non-crystalline amorphous domains.
| Original language | English |
|---|---|
| Pages (from-to) | 1462-1466 |
| Number of pages | 5 |
| Journal | Polymer |
| Volume | 28 |
| Issue number | 9 |
| DOIs | |
| State | Published - Aug 1987 |
Keywords
- block copolymer
- crystallinity
- e.s.c.a.
- surface analysis
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