Surface Analysis in the TEM

Krishna Rajan; Peter Sewell

doi:10.1007/BF03258578

Surface Analysis in the TEM

Krishna Rajan
, Peter Sewell

Department of Materials Design and Innovation

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

There has been a revival in the field of imaging solid surfaces with forward scattered electrons using new transmission electron microscopes (TEMs). The availability of a better vacuum in the region of the specimen has made it feasible to study solid surfaces by imaging, diffraction and microanalytical techniques in the TEM. Some of the methods are TEM techniques which have been adapted to study bulk surfaces. The different techniques are at various stages of development, but they all possess potential with the advent of ultrahigh vacuum systems.

Original language	English
Pages (from-to)	34-35
Number of pages	2
Journal	JOM
Volume	38
Issue number	10
DOIs	https://doi.org/10.1007/BF03258578
State	Published - Oct 1986

Access to Document

10.1007/BF03258578

Cite this

@article{fb0069b4462042b5b1d87dfcb74f5b6c,

title = "Surface Analysis in the TEM",

abstract = "There has been a revival in the field of imaging solid surfaces with forward scattered electrons using new transmission electron microscopes (TEMs). The availability of a better vacuum in the region of the specimen has made it feasible to study solid surfaces by imaging, diffraction and microanalytical techniques in the TEM. Some of the methods are TEM techniques which have been adapted to study bulk surfaces. The different techniques are at various stages of development, but they all possess potential with the advent of ultrahigh vacuum systems.",

author = "Krishna Rajan and Peter Sewell",

year = "1986",

month = oct,

doi = "10.1007/BF03258578",

language = "English",

volume = "38",

pages = "34--35",

journal = "JOM",

issn = "1047-4838",

publisher = "Minerals, Metals and Materials Society",

number = "10",

}

TY - JOUR

T1 - Surface Analysis in the TEM

AU - Rajan, Krishna

AU - Sewell, Peter

PY - 1986/10

Y1 - 1986/10

N2 - There has been a revival in the field of imaging solid surfaces with forward scattered electrons using new transmission electron microscopes (TEMs). The availability of a better vacuum in the region of the specimen has made it feasible to study solid surfaces by imaging, diffraction and microanalytical techniques in the TEM. Some of the methods are TEM techniques which have been adapted to study bulk surfaces. The different techniques are at various stages of development, but they all possess potential with the advent of ultrahigh vacuum systems.

AB - There has been a revival in the field of imaging solid surfaces with forward scattered electrons using new transmission electron microscopes (TEMs). The availability of a better vacuum in the region of the specimen has made it feasible to study solid surfaces by imaging, diffraction and microanalytical techniques in the TEM. Some of the methods are TEM techniques which have been adapted to study bulk surfaces. The different techniques are at various stages of development, but they all possess potential with the advent of ultrahigh vacuum systems.

UR - https://www.scopus.com/pages/publications/84875817874

U2 - 10.1007/BF03258578

DO - 10.1007/BF03258578

M3 - Article

AN - SCOPUS:84875817874

SN - 1047-4838

VL - 38

SP - 34

EP - 35

JO - JOM

JF - JOM

IS - 10

ER -

Surface Analysis in the TEM

Abstract

Access to Document

Other files and links

Fingerprint

Cite this