Structural properties of Ba0.6Sr0.4TiO3 thin films on epitaxial RuO2 electrodes

Q. X. Jia; C. Kwon; P. Lu

doi:10.1080/10584589908215578

Structural properties of Ba_0.6Sr_0.4TiO₃ thin films on epitaxial RuO₂ electrodes

Q. X. Jia
, C. Kwon
, P. Lu

Department of Materials Design and Innovation

Los Alamos National Laboratory
New Mexico Institute of Mining and Technology

Research output: Contribution to journal › Conference article › peer-review

3 Scopus citations

Abstract

For the first time, we have demonstrated that epitaxial Ba_0.6Sr_0.4TiO₃ thin films can be grown on the epitaxial RuO₂ electrodes by pulsed laser ablation. The Ba_0.6Sr_0.4TiO₃ films, deposited on epitaxial (200) oriented RuO₂ grown on (100) yttria-stabilized zirconia, exhibit single out-of-plane orientation as well as in-plane alignments. The detailed epitaxial relationships between the Ba_0.6Sr_0.4TiO₃ films and the RuO₂ electrodes have been analyzed by X-ray diffraction and transmission electron microscopy.

Original language	English
Pages (from-to)	57-63
Number of pages	7
Journal	Integrated Ferroelectrics
Volume	24
Issue number	1
DOIs	https://doi.org/10.1080/10584589908215578
State	Published - 1999
Event	The 11th International Symposium on Integrated Ferroelectrics (ISIF99) - Colorado Springs, CO, USA Duration: Mar 7 1999 → Mar 10 1999

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title = "Structural properties of Ba0.6Sr0.4TiO3 thin films on epitaxial RuO2 electrodes",

abstract = "For the first time, we have demonstrated that epitaxial Ba0.6Sr0.4TiO3 thin films can be grown on the epitaxial RuO2 electrodes by pulsed laser ablation. The Ba0.6Sr0.4TiO3 films, deposited on epitaxial (200) oriented RuO2 grown on (100) yttria-stabilized zirconia, exhibit single out-of-plane orientation as well as in-plane alignments. The detailed epitaxial relationships between the Ba0.6Sr0.4TiO3 films and the RuO2 electrodes have been analyzed by X-ray diffraction and transmission electron microscopy.",

author = "Jia, \{Q. X.\} and C. Kwon and P. Lu",

year = "1999",

doi = "10.1080/10584589908215578",

language = "English",

volume = "24",

pages = "57--63",

journal = "Integrated Ferroelectrics",

issn = "1058-4587",

publisher = "Taylor and Francis Ltd.",

number = "1",

note = "The 11th International Symposium on Integrated Ferroelectrics (ISIF99) ; Conference date: 07-03-1999 Through 10-03-1999",

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TY - JOUR

T1 - Structural properties of Ba0.6Sr0.4TiO3 thin films on epitaxial RuO2 electrodes

AU - Jia, Q. X.

AU - Kwon, C.

AU - Lu, P.

PY - 1999

Y1 - 1999

N2 - For the first time, we have demonstrated that epitaxial Ba0.6Sr0.4TiO3 thin films can be grown on the epitaxial RuO2 electrodes by pulsed laser ablation. The Ba0.6Sr0.4TiO3 films, deposited on epitaxial (200) oriented RuO2 grown on (100) yttria-stabilized zirconia, exhibit single out-of-plane orientation as well as in-plane alignments. The detailed epitaxial relationships between the Ba0.6Sr0.4TiO3 films and the RuO2 electrodes have been analyzed by X-ray diffraction and transmission electron microscopy.

AB - For the first time, we have demonstrated that epitaxial Ba0.6Sr0.4TiO3 thin films can be grown on the epitaxial RuO2 electrodes by pulsed laser ablation. The Ba0.6Sr0.4TiO3 films, deposited on epitaxial (200) oriented RuO2 grown on (100) yttria-stabilized zirconia, exhibit single out-of-plane orientation as well as in-plane alignments. The detailed epitaxial relationships between the Ba0.6Sr0.4TiO3 films and the RuO2 electrodes have been analyzed by X-ray diffraction and transmission electron microscopy.

UR - https://www.scopus.com/pages/publications/0033295924

U2 - 10.1080/10584589908215578

DO - 10.1080/10584589908215578

M3 - Conference article

AN - SCOPUS:0033295924

SN - 1058-4587

VL - 24

SP - 57

EP - 63

JO - Integrated Ferroelectrics

JF - Integrated Ferroelectrics

IS - 1

T2 - The 11th International Symposium on Integrated Ferroelectrics (ISIF99)

Y2 - 7 March 1999 through 10 March 1999

ER -

Structural properties of Ba_0.6Sr_0.4TiO₃ thin films on epitaxial RuO₂ electrodes

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