Abstract
Epitaxial ferromagnetic SrRuO3 thin films with a room-temperature resistivity of 300 μΩ-cm have been successfully grown on LaAlO3(001) substrates at a processing temperature in the range of 550-750°C by a polymer-assisted deposition technique. X-ray diffraction analysis shows good epitaxial quality of SrRuO3 thin films, giving values of the full width at half-maximum (FWHM) of 0.42° from the rocking curve for the (002) reflection and 1.1° from the in-plane φ scan for the (204) reflection. Both the resistivity and the magnetization versus temperature measurements show that the SrRuO3 films are ferromagnetic with a transition temperature of 160 K. The spontaneous magnetization near the ferromagnetic transition follows the scaling law, and the low-temperature magnetization follows the Bloch law.
| Original language | English |
|---|---|
| Pages (from-to) | 7497-7500 |
| Number of pages | 4 |
| Journal | Journal of Physical Chemistry B |
| Volume | 111 |
| Issue number | 26 |
| DOIs | |
| State | Published - Jul 5 2007 |
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