Structural and dielectric properties of Ba 0.6Sr 0.4T iO 3 thin films

Q. X. Jia; J. S. Lee; B. H. Park; P. Lu

Structural and dielectric properties of Ba _0.6Sr _0.4T _iO ₃ thin films

Q. X. Jia
, J. S. Lee
, B. H. Park
, P. Lu

Department of Materials Design and Innovation

Los Alamos National Laboratory
Konkuk University
New Mexico Institute of Mining and Technology

Research output: Contribution to conference › Paper › peer-review

Abstract

We report a systematic study of the structural and dielectric properties of barium strontium titanate, Ba _0.6Sr _0.4T _iO ₃ (BST-0.4), films grown by pulsed laser deposition on LaAlO ₃ and MgO substrates. By optimizing the processing conditions, choosing appropriate substrate materials, and constructing layered architectures, we have successfully deposited BST-0.4 films on both LaAlO ₃ and MgO substrates with large dielectric nonlinearity and low dielectric loss. X-ray diffraction and transmission electron microscopy analyses reveal that the dielectric tunability and the dielectric loss are closely related to the crystallinity of the BST-0.4 films. We have also observed that a small variation of D value, defined as the ratio of in-plane lattice constant/out-of-plane lattice constant, can result in a significantly large change of dielectric properties of the BST films.

Original language	English
Pages	161-166
Number of pages	6
State	Published - 2005
Event	Epitaxial Growth of Functional Oxides - Proceedings of the International Symposium - Orlando, FL, United States Duration: Oct 12 2003 → Oct 17 2003

Conference

Conference	Epitaxial Growth of Functional Oxides - Proceedings of the International Symposium
Country/Territory	United States
City	Orlando, FL
Period	10/12/03 → 10/17/03

Cite this

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title = "Structural and dielectric properties of Ba 0.6Sr 0.4T iO 3 thin films",

abstract = "We report a systematic study of the structural and dielectric properties of barium strontium titanate, Ba 0.6Sr 0.4T iO 3 (BST-0.4), films grown by pulsed laser deposition on LaAlO 3 and MgO substrates. By optimizing the processing conditions, choosing appropriate substrate materials, and constructing layered architectures, we have successfully deposited BST-0.4 films on both LaAlO 3 and MgO substrates with large dielectric nonlinearity and low dielectric loss. X-ray diffraction and transmission electron microscopy analyses reveal that the dielectric tunability and the dielectric loss are closely related to the crystallinity of the BST-0.4 films. We have also observed that a small variation of D value, defined as the ratio of in-plane lattice constant/out-of-plane lattice constant, can result in a significantly large change of dielectric properties of the BST films.",

author = "Jia, \{Q. X.\} and Lee, \{J. S.\} and Park, \{B. H.\} and P. Lu",

year = "2005",

language = "English",

pages = "161--166",

note = "Epitaxial Growth of Functional Oxides - Proceedings of the International Symposium ; Conference date: 12-10-2003 Through 17-10-2003",

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TY - CONF

T1 - Structural and dielectric properties of Ba 0.6Sr 0.4T iO 3 thin films

AU - Jia, Q. X.

AU - Lee, J. S.

AU - Park, B. H.

AU - Lu, P.

PY - 2005

Y1 - 2005

N2 - We report a systematic study of the structural and dielectric properties of barium strontium titanate, Ba 0.6Sr 0.4T iO 3 (BST-0.4), films grown by pulsed laser deposition on LaAlO 3 and MgO substrates. By optimizing the processing conditions, choosing appropriate substrate materials, and constructing layered architectures, we have successfully deposited BST-0.4 films on both LaAlO 3 and MgO substrates with large dielectric nonlinearity and low dielectric loss. X-ray diffraction and transmission electron microscopy analyses reveal that the dielectric tunability and the dielectric loss are closely related to the crystallinity of the BST-0.4 films. We have also observed that a small variation of D value, defined as the ratio of in-plane lattice constant/out-of-plane lattice constant, can result in a significantly large change of dielectric properties of the BST films.

AB - We report a systematic study of the structural and dielectric properties of barium strontium titanate, Ba 0.6Sr 0.4T iO 3 (BST-0.4), films grown by pulsed laser deposition on LaAlO 3 and MgO substrates. By optimizing the processing conditions, choosing appropriate substrate materials, and constructing layered architectures, we have successfully deposited BST-0.4 films on both LaAlO 3 and MgO substrates with large dielectric nonlinearity and low dielectric loss. X-ray diffraction and transmission electron microscopy analyses reveal that the dielectric tunability and the dielectric loss are closely related to the crystallinity of the BST-0.4 films. We have also observed that a small variation of D value, defined as the ratio of in-plane lattice constant/out-of-plane lattice constant, can result in a significantly large change of dielectric properties of the BST films.

UR - https://www.scopus.com/pages/publications/28544452391

M3 - Paper

AN - SCOPUS:28544452391

SP - 161

EP - 166

T2 - Epitaxial Growth of Functional Oxides - Proceedings of the International Symposium

Y2 - 12 October 2003 through 17 October 2003

ER -

Structural and dielectric properties of Ba _0.6Sr _0.4T _iO ₃ thin films

Abstract

Conference

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