Abstract
In the current work molecular secondary emission from diacetylene thin films on solid metal supports has been studied. The use of static-SIMS to monitor the extent of UV photo-polymerization in diacetylene thin films via the appearance or disappearance of molecular emission has been investigated. In addition, the potential of static-SIMS to quantify the extent of surface polymerization is discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 863 |
| Number of pages | 1 |
| Journal | Polymeric Materials Science and Engineering, Proceedings of the ACS Division of Polymeric Materials Science and Engineering |
| Volume | 62 |
| State | Published - 1990 |
| Event | Proceedings of the ACS Division of Polymeric Materials: Science and Engineering - Boston, MA, USA Duration: Apr 1 1990 → Apr 1 1990 |
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