Static secondary ion mass spectrometry of polymer systems

Poly (alkyl methacrylates) were studied by static secondary Ion mass spectrometry (SIMS), to obtain mass spectra of the polymer surface. Results from an homologous series provide a direct fingerprint for each member of the series, unobtainable with standard ionlzation methods in mass spectrometry. Results also show the characterization of surface impuritles, present from processing. Analysis of characteristic mass fragmentation patterns provides a method for examination of the process(es) of secondary ionization and ejection of molecular ions during the SIMS process. Results show the utility of SIMS as an analytical tool to investigate polymer surface structure. A second portion of this report gives preliminary results on the use of SIMS to investigate mechanisms of surface degradation using model reactions; SIMS shows increased surface sensitivity for analysis of reactive effects over ESCA.