Stability of de superconducting quantum interference devices fabricated using ramp-edge superconductor/normal-metal/superconductor technology

Q. X. Jia; D. Reagor; C. Mombourquette; Y. Fan; J. Decker; P. D'Alessandris

doi:10.1063/1.120015

Stability of de superconducting quantum interference devices fabricated using ramp-edge superconductor/normal-metal/superconductor technology

Q. X. Jia
, D. Reagor
, C. Mombourquette
, Y. Fan
, J. Decker
, P. D'Alessandris

Department of Materials Design and Innovation

Los Alamos National Laboratory Materials Science and Technology Division
Monroe Community College

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

The degradation with time was determined for high-temperature superconducting quantum interference devices (SQUIDs) with ramp-edge geometry Josephson junctions (Ag:YBa₂Cu₃O_7-x/PrBa₂Cu ₃O_7-x/Ag:YBa₂Cu₃O_7-x). The critical current of the devices tended to decrease with a mean percentage of less than 7% over a period of more than 500 days. The junction resistance, on the other hand, increased with a mean percentage of 5%. The voltage modulation of the SQUIDs was unchanged within experimental reproducibility, presumably due to the cancellation of the changes in critical current and resistance.

Original language	English
Pages (from-to)	1721-1723
Number of pages	3
Journal	Applied Physics Letters
Volume	71
Issue number	12
DOIs	https://doi.org/10.1063/1.120015
State	Published - Sep 22 1997

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title = "Stability of de superconducting quantum interference devices fabricated using ramp-edge superconductor/normal-metal/superconductor technology",

abstract = "The degradation with time was determined for high-temperature superconducting quantum interference devices (SQUIDs) with ramp-edge geometry Josephson junctions (Ag:YBa2Cu3O7-x/PrBa2Cu 3O7-x/Ag:YBa2Cu3O7-x). The critical current of the devices tended to decrease with a mean percentage of less than 7\% over a period of more than 500 days. The junction resistance, on the other hand, increased with a mean percentage of 5\%. The voltage modulation of the SQUIDs was unchanged within experimental reproducibility, presumably due to the cancellation of the changes in critical current and resistance.",

author = "Jia, \{Q. X.\} and D. Reagor and C. Mombourquette and Y. Fan and J. Decker and P. D'Alessandris",

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T1 - Stability of de superconducting quantum interference devices fabricated using ramp-edge superconductor/normal-metal/superconductor technology

AU - Jia, Q. X.

AU - Reagor, D.

AU - Mombourquette, C.

AU - Fan, Y.

AU - Decker, J.

AU - D'Alessandris, P.

PY - 1997/9/22

Y1 - 1997/9/22

N2 - The degradation with time was determined for high-temperature superconducting quantum interference devices (SQUIDs) with ramp-edge geometry Josephson junctions (Ag:YBa2Cu3O7-x/PrBa2Cu 3O7-x/Ag:YBa2Cu3O7-x). The critical current of the devices tended to decrease with a mean percentage of less than 7% over a period of more than 500 days. The junction resistance, on the other hand, increased with a mean percentage of 5%. The voltage modulation of the SQUIDs was unchanged within experimental reproducibility, presumably due to the cancellation of the changes in critical current and resistance.

AB - The degradation with time was determined for high-temperature superconducting quantum interference devices (SQUIDs) with ramp-edge geometry Josephson junctions (Ag:YBa2Cu3O7-x/PrBa2Cu 3O7-x/Ag:YBa2Cu3O7-x). The critical current of the devices tended to decrease with a mean percentage of less than 7% over a period of more than 500 days. The junction resistance, on the other hand, increased with a mean percentage of 5%. The voltage modulation of the SQUIDs was unchanged within experimental reproducibility, presumably due to the cancellation of the changes in critical current and resistance.

UR - https://www.scopus.com/pages/publications/6044235442

U2 - 10.1063/1.120015

DO - 10.1063/1.120015

M3 - Article

AN - SCOPUS:6044235442

SN - 0003-6951

VL - 71

SP - 1721

EP - 1723

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 12

ER -

Stability of de superconducting quantum interference devices fabricated using ramp-edge superconductor/normal-metal/superconductor technology

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