Abstract
Nickel monosilicide (NiSi) nanowires (NWs) were grown at a relatively low temperature of 575 °C by the Metal Induced Growth (MIG) method without using a gas type silicon source. In the MIG technique, silicon dioxide is first plasma deposited onto a Si wafer followed by 20-160 nm of Ni. Si is then deposited by D.C. magnetron sputtering on the heated substrate. A nickel silicide is first formed which then leads to nanowire formation. Nanowires were a single crystal structure, 20-100 nm in diameter and 1-10 μm in length. Composition and structure were verified by high-resolution transmission electron microscopy (HRTEM) and Raman spectroscopy. The mechanism of NiSi nanowire formation is discussed herein.
| Original language | English |
|---|---|
| Pages (from-to) | 60-65 |
| Number of pages | 6 |
| Journal | Thin Solid Films |
| Volume | 483 |
| Issue number | 1-2 |
| DOIs | |
| State | Published - Jul 1 2005 |
Keywords
- DC magnetron sputtering
- Low temperature
- Metal Induced Growth (MIG)
- NiSi nanowires (NWs)
Fingerprint
Dive into the research topics of 'Spontaneous nickel monosilicide nanowire formation by metal induced growth'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver