Abstract
We report new specific heat data for 4He confined between two silicon wafers at sub-μm separation. The measurement technique is discussed, as well as the results which are relevant to theories of finite-size scaling. We compare our data to calculations of the scaling function and to earlier experimental results.
| Original language | English |
|---|---|
| Pages (from-to) | 173-174 |
| Number of pages | 2 |
| Journal | Czechoslovak Journal of Physics |
| Volume | 46 |
| Issue number | SUPPL. 1 |
| DOIs | |
| State | Published - 1996 |
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