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Specific heat of 4He confined between two silicon wafer+

  • SUNY Buffalo

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

We report new specific heat data for 4He confined between two silicon wafers at sub-μm separation. The measurement technique is discussed, as well as the results which are relevant to theories of finite-size scaling. We compare our data to calculations of the scaling function and to earlier experimental results.

Original languageEnglish
Pages (from-to)173-174
Number of pages2
JournalCzechoslovak Journal of Physics
Volume46
Issue numberSUPPL. 1
DOIs
StatePublished - 1996

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