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Specific heat and scaling of 4He confined in a planar geometry

  • SUNY Buffalo

Research output: Contribution to journalArticlepeer-review

55 Scopus citations

Abstract

We report measurements of the specific heat of thick helium films to test scaling predictions near the superfluid transition Tλ hese films, bounded by two silicon wafers, range in thickness from 0.107 to 0.692 μm. The specific heat of the films is suppressed relative to that of bulk helium, and the difference of the data from bulk helium scales well with the exponent of the correlation length. We propose an empirical scaling function which fits the data well for [Formula Presented], and yields the surface specific heat. We also compare the data with various theoretical calculations and experiments. We find that the calculations underestimate the effect of confinement.

Original languageEnglish
Pages (from-to)2596-2599
Number of pages4
JournalPhysical Review Letters
Volume78
Issue number13
DOIs
StatePublished - Mar 31 1997

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