Special session 8: New topics at-speed testing in the face of process variations

Chandu Visweswariah; Vladimir Zolotov; Jinjun Xiong

doi:10.1109/VTS.2009.72

Special session 8: New topics at-speed testing in the face of process variations

Chandu Visweswariah
, Vladimir Zolotov
, Jinjun Xiong

Department of Computer Science and Engineering

IBM

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	Proceedings - 2009 27th IEEE VLSI Test Symposium, VTS 2009
Pages	237
Number of pages	1
DOIs	https://doi.org/10.1109/VTS.2009.72
State	Published - 2009
Event	2009 27th IEEE VLSI Test Symposium, VTS 2009 - Santa Cruz, CA, United States Duration: May 3 2009 → May 7 2009

Publication series

Name	Proceedings of the IEEE VLSI Test Symposium

Conference

Conference	2009 27th IEEE VLSI Test Symposium, VTS 2009
Country/Territory	United States
City	Santa Cruz, CA
Period	05/3/09 → 05/7/09

Access to Document

10.1109/VTS.2009.72

Cite this

@inproceedings{f085467a57504a3f8918140f9691568e,

title = "Special session 8: New topics at-speed testing in the face of process variations",

author = "Chandu Visweswariah and Vladimir Zolotov and Jinjun Xiong",

year = "2009",

doi = "10.1109/VTS.2009.72",

language = "English",

isbn = "9780769535982",

series = "Proceedings of the IEEE VLSI Test Symposium",

pages = "237",

booktitle = "Proceedings - 2009 27th IEEE VLSI Test Symposium, VTS 2009",

note = "2009 27th IEEE VLSI Test Symposium, VTS 2009 ; Conference date: 03-05-2009 Through 07-05-2009",

}

Visweswariah, C, Zolotov, V & Xiong, J 2009, Special session 8: New topics at-speed testing in the face of process variations. in Proceedings - 2009 27th IEEE VLSI Test Symposium, VTS 2009., 5116640, Proceedings of the IEEE VLSI Test Symposium, pp. 237, 2009 27th IEEE VLSI Test Symposium, VTS 2009, Santa Cruz, CA, United States, 05/3/09. https://doi.org/10.1109/VTS.2009.72

Special session 8: New topics at-speed testing in the face of process variations. / Visweswariah, Chandu; Zolotov, Vladimir; Xiong, Jinjun.
Proceedings - 2009 27th IEEE VLSI Test Symposium, VTS 2009. 2009. p. 237 5116640 (Proceedings of the IEEE VLSI Test Symposium).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Special session 8

T2 - 2009 27th IEEE VLSI Test Symposium, VTS 2009

AU - Visweswariah, Chandu

AU - Zolotov, Vladimir

AU - Xiong, Jinjun

PY - 2009

Y1 - 2009

UR - https://www.scopus.com/pages/publications/70350380896

U2 - 10.1109/VTS.2009.72

DO - 10.1109/VTS.2009.72

M3 - Conference contribution

AN - SCOPUS:70350380896

SN - 9780769535982

T3 - Proceedings of the IEEE VLSI Test Symposium

SP - 237

BT - Proceedings - 2009 27th IEEE VLSI Test Symposium, VTS 2009

Y2 - 3 May 2009 through 7 May 2009

ER -

Special session 8: New topics at-speed testing in the face of process variations

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