Skip to main navigation Skip to search Skip to main content

Short-range-order structure of an InGaAs compound semiconductor grown by liquid-phase epitaxy

  • S. C. Woronick
  • , E. Canova
  • , Y. H. Kao
  • , M. E. Hills
  • , T. W. Nee
  • , Victor Rehn
  • Stony Brook University
  • United States Navy

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

Extended x-ray absorption fine structure has been measured in an In 0.53Ga0.47As compound grown by liquid-phase epitaxy. The fluorescence measurement technique was used so as to preserve the integrity of the as-grown sample. Results indicate that the virtual crystal approximation is invalid in this system, and that the structure contains significant disorder in the cation and anion sublattices. The nearest-neighbor environment around each constituent atom, however, appears to be well ordered.

Original languageEnglish
Pages (from-to)2836-2839
Number of pages4
JournalJournal of Applied Physics
Volume61
Issue number8
DOIs
StatePublished - 1987

Fingerprint

Dive into the research topics of 'Short-range-order structure of an InGaAs compound semiconductor grown by liquid-phase epitaxy'. Together they form a unique fingerprint.

Cite this