Abstract
Extended x-ray absorption fine structure has been measured in an In 0.53Ga0.47As compound grown by liquid-phase epitaxy. The fluorescence measurement technique was used so as to preserve the integrity of the as-grown sample. Results indicate that the virtual crystal approximation is invalid in this system, and that the structure contains significant disorder in the cation and anion sublattices. The nearest-neighbor environment around each constituent atom, however, appears to be well ordered.
| Original language | English |
|---|---|
| Pages (from-to) | 2836-2839 |
| Number of pages | 4 |
| Journal | Journal of Applied Physics |
| Volume | 61 |
| Issue number | 8 |
| DOIs | |
| State | Published - 1987 |
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