Scanning tunneling microscope investigation of the current-voltage characteristics of a newly engineered π-electron molecule

Govind Mallick; Anubhav Srivastava; Sarah Lastella; Qingdong Zheng; Paras N. Prasad; Alma E. Wickenden; Madan Dubey; Shashi P. Karna

doi:10.1109/NANO.2005.1500694

Scanning tunneling microscope investigation of the current-voltage characteristics of a newly engineered π-electron molecule

Govind Mallick
, Anubhav Srivastava
, Sarah Lastella
, Qingdong Zheng
, Paras N. Prasad
, Alma E. Wickenden
, Madan Dubey
, Shashi P. Karna

Chemistry

IEEE
U.S. Army Research Laboratory
SUNY Buffalo

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Current (I)-Voltage (V) characteristics of the self-assembled monolayer (SAM) of π-conjugated, 4,4'-[1,4-phenylenebis(methylidynenitrilo)]bisbenzene thiolate (PMNBT) adsorbed on Au (111) substrate have been investigated by scanning tunneling microscopy (STM). The measured tunneling current in the case of PMNBT SAM is much higher than that in the case of dodecanemonothiolate (DDMT) molecules. Furthermore, the PMNBT SAMs appear to exhibit a pronounced rectification of the tunneling current not observed in the case of DDMT. Possible reasons for the difference between the I-V characteristics of the two molecules are identified.

Original language	English
Title of host publication	2005 5th IEEE Conference on Nanotechnology
Publisher	IEEE Computer Society
Pages	69-72
Number of pages	4
ISBN (Print)	0780391993, 9780780391994
DOIs	https://doi.org/10.1109/NANO.2005.1500694
State	Published - 2005
Event	2005 5th IEEE Conference on Nanotechnology - Nagoya, Japan Duration: Jul 11 2005 → Jul 15 2005

Publication series

Name	2005 5th IEEE Conference on Nanotechnology
Volume	1

Conference

Conference	2005 5th IEEE Conference on Nanotechnology
Country/Territory	Japan
City	Nagoya
Period	07/11/05 → 07/15/05

Keywords

Atomic Force Microscopy (AFM)
Rectification
Scanning Tunneling Microscopy (STM)
Self Assembled Monolayers (SAM)

Access to Document

10.1109/NANO.2005.1500694

Cite this

Mallick, G., Srivastava, A., Lastella, S., Zheng, Q., Prasad, P. N., Wickenden, A. E., Dubey, M., & Karna, S. P. (2005). Scanning tunneling microscope investigation of the current-voltage characteristics of a newly engineered π-electron molecule. In 2005 5th IEEE Conference on Nanotechnology (pp. 69-72). Article 1500694 (2005 5th IEEE Conference on Nanotechnology; Vol. 1). IEEE Computer Society. https://doi.org/10.1109/NANO.2005.1500694

@inproceedings{63d7856b56d449e7a983f9fb2338dc5a,

title = "Scanning tunneling microscope investigation of the current-voltage characteristics of a newly engineered π-electron molecule",

abstract = "Current (I)-Voltage (V) characteristics of the self-assembled monolayer (SAM) of π-conjugated, 4,4'-[1,4-phenylenebis(methylidynenitrilo)]bisbenzene thiolate (PMNBT) adsorbed on Au (111) substrate have been investigated by scanning tunneling microscopy (STM). The measured tunneling current in the case of PMNBT SAM is much higher than that in the case of dodecanemonothiolate (DDMT) molecules. Furthermore, the PMNBT SAMs appear to exhibit a pronounced rectification of the tunneling current not observed in the case of DDMT. Possible reasons for the difference between the I-V characteristics of the two molecules are identified.",

keywords = "Atomic Force Microscopy (AFM), Rectification, Scanning Tunneling Microscopy (STM), Self Assembled Monolayers (SAM)",

author = "Govind Mallick and Anubhav Srivastava and Sarah Lastella and Qingdong Zheng and Prasad, \{Paras N.\} and Wickenden, \{Alma E.\} and Madan Dubey and Karna, \{Shashi P.\}",

year = "2005",

doi = "10.1109/NANO.2005.1500694",

language = "English",

isbn = "0780391993",

series = "2005 5th IEEE Conference on Nanotechnology",

publisher = "IEEE Computer Society",

pages = "69--72",

booktitle = "2005 5th IEEE Conference on Nanotechnology",

address = "United States",

note = "2005 5th IEEE Conference on Nanotechnology ; Conference date: 11-07-2005 Through 15-07-2005",

}

Mallick, G, Srivastava, A, Lastella, S, Zheng, Q, Prasad, PN, Wickenden, AE, Dubey, M & Karna, SP 2005, Scanning tunneling microscope investigation of the current-voltage characteristics of a newly engineered π-electron molecule. in 2005 5th IEEE Conference on Nanotechnology., 1500694, 2005 5th IEEE Conference on Nanotechnology, vol. 1, IEEE Computer Society, pp. 69-72, 2005 5th IEEE Conference on Nanotechnology, Nagoya, Japan, 07/11/05. https://doi.org/10.1109/NANO.2005.1500694

Scanning tunneling microscope investigation of the current-voltage characteristics of a newly engineered π-electron molecule. / Mallick, Govind; Srivastava, Anubhav; Lastella, Sarah et al.
2005 5th IEEE Conference on Nanotechnology. IEEE Computer Society, 2005. p. 69-72 1500694 (2005 5th IEEE Conference on Nanotechnology; Vol. 1).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Scanning tunneling microscope investigation of the current-voltage characteristics of a newly engineered π-electron molecule

AU - Mallick, Govind

AU - Srivastava, Anubhav

AU - Lastella, Sarah

AU - Zheng, Qingdong

AU - Prasad, Paras N.

AU - Wickenden, Alma E.

AU - Dubey, Madan

AU - Karna, Shashi P.

PY - 2005

Y1 - 2005

N2 - Current (I)-Voltage (V) characteristics of the self-assembled monolayer (SAM) of π-conjugated, 4,4'-[1,4-phenylenebis(methylidynenitrilo)]bisbenzene thiolate (PMNBT) adsorbed on Au (111) substrate have been investigated by scanning tunneling microscopy (STM). The measured tunneling current in the case of PMNBT SAM is much higher than that in the case of dodecanemonothiolate (DDMT) molecules. Furthermore, the PMNBT SAMs appear to exhibit a pronounced rectification of the tunneling current not observed in the case of DDMT. Possible reasons for the difference between the I-V characteristics of the two molecules are identified.

AB - Current (I)-Voltage (V) characteristics of the self-assembled monolayer (SAM) of π-conjugated, 4,4'-[1,4-phenylenebis(methylidynenitrilo)]bisbenzene thiolate (PMNBT) adsorbed on Au (111) substrate have been investigated by scanning tunneling microscopy (STM). The measured tunneling current in the case of PMNBT SAM is much higher than that in the case of dodecanemonothiolate (DDMT) molecules. Furthermore, the PMNBT SAMs appear to exhibit a pronounced rectification of the tunneling current not observed in the case of DDMT. Possible reasons for the difference between the I-V characteristics of the two molecules are identified.

KW - Atomic Force Microscopy (AFM)

KW - Rectification

KW - Scanning Tunneling Microscopy (STM)

KW - Self Assembled Monolayers (SAM)

UR - https://www.scopus.com/pages/publications/33746954173

U2 - 10.1109/NANO.2005.1500694

DO - 10.1109/NANO.2005.1500694

M3 - Conference contribution

AN - SCOPUS:33746954173

SN - 0780391993

SN - 9780780391994

T3 - 2005 5th IEEE Conference on Nanotechnology

SP - 69

EP - 72

BT - 2005 5th IEEE Conference on Nanotechnology

PB - IEEE Computer Society

T2 - 2005 5th IEEE Conference on Nanotechnology

Y2 - 11 July 2005 through 15 July 2005

ER -

Mallick G, Srivastava A, Lastella S, Zheng Q, Prasad PN, Wickenden AE et al. Scanning tunneling microscope investigation of the current-voltage characteristics of a newly engineered π-electron molecule. In 2005 5th IEEE Conference on Nanotechnology. IEEE Computer Society. 2005. p. 69-72. 1500694. (2005 5th IEEE Conference on Nanotechnology). doi: 10.1109/NANO.2005.1500694

Scanning tunneling microscope investigation of the current-voltage characteristics of a newly engineered π-electron molecule

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Keywords

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