Scanning methods applied to bitemark analysis

Peter J. Bush; Mary A. Bush

doi:10.1117/12.853312

Scanning methods applied to bitemark analysis

Restorative Dentistry Administration

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The 2009 National Academy of Sciences report on forensics focused criticism on pattern evidence subdisciplines in which statements of unique identity are utilized. One principle of bitemark analysis is that the human dentition is unique to the extent that a perpetrator may be identified based on dental traits in a bitemark. Optical and electron scanning methods were used to measure dental minutia and to investigate replication of detail in human skin. Results indicated that being a visco-elastic substrate, skin effectively reduces the resolution of measurement of dental detail. Conclusions indicate caution in individualization statements.

Original language	English
Title of host publication	Scanning Microscopy 2010
DOIs	https://doi.org/10.1117/12.853312
State	Published - 2010
Event	Scanning Microscopy 2010 - Monterey, CA, United States Duration: May 17 2010 → May 19 2010

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	7729
ISSN (Print)	0277-786X

Conference

Conference	Scanning Microscopy 2010
Country/Territory	United States
City	Monterey, CA
Period	05/17/10 → 05/19/10

Keywords

bitemark research
bitemarks
detail transfer
Forensic odontology
SEM
skin

Access to Document

10.1117/12.853312

Cite this

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title = "Scanning methods applied to bitemark analysis",

abstract = "The 2009 National Academy of Sciences report on forensics focused criticism on pattern evidence subdisciplines in which statements of unique identity are utilized. One principle of bitemark analysis is that the human dentition is unique to the extent that a perpetrator may be identified based on dental traits in a bitemark. Optical and electron scanning methods were used to measure dental minutia and to investigate replication of detail in human skin. Results indicated that being a visco-elastic substrate, skin effectively reduces the resolution of measurement of dental detail. Conclusions indicate caution in individualization statements.",

keywords = "bitemark research, bitemarks, detail transfer, Forensic odontology, SEM, skin",

author = "Bush, \{Peter J.\} and Bush, \{Mary A.\}",

year = "2010",

doi = "10.1117/12.853312",

language = "English",

isbn = "9780819482174",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

booktitle = "Scanning Microscopy 2010",

note = "Scanning Microscopy 2010 ; Conference date: 17-05-2010 Through 19-05-2010",

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AU - Bush, Peter J.

AU - Bush, Mary A.

PY - 2010

Y1 - 2010

N2 - The 2009 National Academy of Sciences report on forensics focused criticism on pattern evidence subdisciplines in which statements of unique identity are utilized. One principle of bitemark analysis is that the human dentition is unique to the extent that a perpetrator may be identified based on dental traits in a bitemark. Optical and electron scanning methods were used to measure dental minutia and to investigate replication of detail in human skin. Results indicated that being a visco-elastic substrate, skin effectively reduces the resolution of measurement of dental detail. Conclusions indicate caution in individualization statements.

AB - The 2009 National Academy of Sciences report on forensics focused criticism on pattern evidence subdisciplines in which statements of unique identity are utilized. One principle of bitemark analysis is that the human dentition is unique to the extent that a perpetrator may be identified based on dental traits in a bitemark. Optical and electron scanning methods were used to measure dental minutia and to investigate replication of detail in human skin. Results indicated that being a visco-elastic substrate, skin effectively reduces the resolution of measurement of dental detail. Conclusions indicate caution in individualization statements.

KW - bitemark research

KW - bitemarks

KW - detail transfer

KW - Forensic odontology

KW - SEM

KW - skin

UR - https://www.scopus.com/pages/publications/77954531751

U2 - 10.1117/12.853312

DO - 10.1117/12.853312

M3 - Conference contribution

AN - SCOPUS:77954531751

SN - 9780819482174

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Scanning Microscopy 2010

T2 - Scanning Microscopy 2010

Y2 - 17 May 2010 through 19 May 2010

ER -

Scanning methods applied to bitemark analysis

Abstract

Publication series

Conference

Keywords

Access to Document

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