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Saturation spectroscopy of carriers in semiconductor multiple-quantum-well structures

  • SUNY Buffalo

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We have performed far infrared cyclotron resonance absorption saturation experiments of both electrons (GaAs/AlGaAs MQW structure) and holes (InGaAs/GaAs <111> strained- layer superlattice) with the Free Electron Laser at UC Santa Barbara, Calif. The Landau level lifetime is found to be laser power dependent at high powers, and is longer for electrons than for holes. Reasons are discussed. Proper analysis of the transmission data is crucial for strongly absorbing multi-layer structures to obtain meaningful results. Limitation of the 3-level model used to determine the lifetimes are also discussed.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherPubl by Int Soc for Optical Engineering
Pages238-244
Number of pages7
ISBN (Print)0819408395, 9780819408396
DOIs
StatePublished - 1992
EventSpectroscopic Characterization Techniques for Semiconductor Technology IV - Somerset, NJ, USA
Duration: Mar 22 1992Mar 22 1992

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1678
ISSN (Print)0277-786X

Conference

ConferenceSpectroscopic Characterization Techniques for Semiconductor Technology IV
CitySomerset, NJ, USA
Period03/22/9203/22/92

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