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Rodrigues-Frank mapping of interface crystallography

Research output: Contribution to conferencePaperpeer-review

Abstract

The utility of Rodrigues-Frank vectors in graphically representing grain boundary misorientation is described in this paper. It is shown that Rodrigues-Frank (R-F) mapping of microstructures is in fact well suited to experimental techniques which characterize grain specific orientation. R-F representations also permit the coupling of grain boundary misorientation associated with crystal symmetry to issues associated with sample symmetry. The different levels of microstructural coupling ranging from lattice symmetry to sample symmetry in the application of Rodrigues-Frank representations are discussed.

Original languageEnglish
Pages39-44
Number of pages6
StatePublished - 1998
EventProceedings of the 1997 TMS Fall Symposium - Indianapolis, IN, USA
Duration: Sep 14 1997Sep 18 1997

Conference

ConferenceProceedings of the 1997 TMS Fall Symposium
CityIndianapolis, IN, USA
Period09/14/9709/18/97

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