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Reverse Recovery and Rectification Characteristic of β-Ga2O3Schottky Barrier Diode

  • SUNY Buffalo

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A gallium oxide (β-Ga2 O3) Schottky barrier diode (SBD) is proposed and characterized. The fabricated diode has an area of 300 μm × 300 μm with a 12 μm unintentionally-doped (UID) (1.7 × 1016 cm-3) Ga2 O3 epitaxial layer on Sn doped (5.4 × 1018 cm-3) (010) Ga2 O3 substrate. The device has 1.02 kV breakdown voltage and 500 mA forward current at 5.5 V. The reverse recovery characteristic and the rectification capability of the diode are experimentally studied. The Ga2 O3 SBD shows a high potential for power device application such as pulse power application.

Original languageEnglish
Title of host publication2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications, WiPDA 2021 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages58-61
Number of pages4
ISBN (Electronic)9781665401814
DOIs
StatePublished - 2021
Event8th Annual IEEE Workshop on Wide Bandgap Power Devices and Applications, WiPDA 2021 - Virtual, Online, United States
Duration: Nov 7 2021Nov 11 2021

Publication series

Name2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications, WiPDA 2021 - Proceedings

Conference

Conference8th Annual IEEE Workshop on Wide Bandgap Power Devices and Applications, WiPDA 2021
Country/TerritoryUnited States
CityVirtual, Online
Period11/7/2111/11/21

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