TY - GEN
T1 - Repetitive pulse testing and modeling of a high power ceramic resistor
AU - Canty, Meredith
AU - Brim, Derek
AU - Ulrich, Joshua
AU - Muffoletto, Daniel P.
AU - Burke, Kevin M.
AU - Zirnheld, Jennifer L.
PY - 2012
Y1 - 2012
N2 - In an effort to understand the failure mechanisms of ceramic resistors when used above their stated limits, a series of pulsed load profiles were applied to an epoxy coated ceramic resistor. A dependent relationship between the pulsed load profiles and the temperature of the epoxy was shown through the series of experiments. From these experiments a safe operating range was found beyond the stated limits. The load profiles that cause failure are evaluated and compared to the results of a lumped element numerical model, which models the thermal characteristics of such a resistor under test and allows for the heating profiles during operation to be predicted.
AB - In an effort to understand the failure mechanisms of ceramic resistors when used above their stated limits, a series of pulsed load profiles were applied to an epoxy coated ceramic resistor. A dependent relationship between the pulsed load profiles and the temperature of the epoxy was shown through the series of experiments. From these experiments a safe operating range was found beyond the stated limits. The load profiles that cause failure are evaluated and compared to the results of a lumped element numerical model, which models the thermal characteristics of such a resistor under test and allows for the heating profiles during operation to be predicted.
UR - https://www.scopus.com/pages/publications/84879941994
U2 - 10.1109/IPMHVC.2012.6518863
DO - 10.1109/IPMHVC.2012.6518863
M3 - Conference contribution
AN - SCOPUS:84879941994
SN - 9781467312233
T3 - Proceedings of the 2012 IEEE International Power Modulator and High Voltage Conference, IPMHVC 2012
SP - 787
EP - 790
BT - Proceedings of the 2012 IEEE International Power Modulator and High Voltage Conference, IPMHVC 2012
T2 - 2012 IEEE International Power Modulator and High Voltage Conference, IPMHVC 2012
Y2 - 3 June 2012 through 7 June 2012
ER -