TY - GEN
T1 - ReMP
T2 - 2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2021
AU - Zhao, Yang
AU - Li, Chunyuan
AU - Yu, Ping
AU - Chen, Changyou
N1 - Publisher Copyright:
© 2021 IEEE.
PY - 2021/6
Y1 - 2021/6
N2 - Few-shot learning features the capability of generalizing from a few examples. In this paper, we first identify that a discriminative feature space, namely a rectified metric space, that is learned to maintain the metric consistency from training to testing, is an essential component to the success of metric-based few-shot learning. Numerous analyses indicate that a simple modification of the objective can yield substantial performance gains. The resulting approach, called rectified metric propagation (ReMP), further optimizes an attentive prototype propagation network, and applies a repulsive force to make confident predictions. Extensive experiments demonstrate that the proposed ReMP is effective and efficient, and outperforms the state of the arts on various standard few-shot learning datasets.
AB - Few-shot learning features the capability of generalizing from a few examples. In this paper, we first identify that a discriminative feature space, namely a rectified metric space, that is learned to maintain the metric consistency from training to testing, is an essential component to the success of metric-based few-shot learning. Numerous analyses indicate that a simple modification of the objective can yield substantial performance gains. The resulting approach, called rectified metric propagation (ReMP), further optimizes an attentive prototype propagation network, and applies a repulsive force to make confident predictions. Extensive experiments demonstrate that the proposed ReMP is effective and efficient, and outperforms the state of the arts on various standard few-shot learning datasets.
UR - https://www.scopus.com/pages/publications/85116004109
U2 - 10.1109/CVPRW53098.2021.00291
DO - 10.1109/CVPRW53098.2021.00291
M3 - Conference contribution
AN - SCOPUS:85116004109
T3 - IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
SP - 2581
EP - 2590
BT - Proceedings - 2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2021
PB - IEEE Computer Society
Y2 - 19 June 2021 through 25 June 2021
ER -