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ReMP: Rectified metric propagation for few-shot learning

  • SUNY Buffalo
  • Microsoft USA

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

8 Scopus citations

Abstract

Few-shot learning features the capability of generalizing from a few examples. In this paper, we first identify that a discriminative feature space, namely a rectified metric space, that is learned to maintain the metric consistency from training to testing, is an essential component to the success of metric-based few-shot learning. Numerous analyses indicate that a simple modification of the objective can yield substantial performance gains. The resulting approach, called rectified metric propagation (ReMP), further optimizes an attentive prototype propagation network, and applies a repulsive force to make confident predictions. Extensive experiments demonstrate that the proposed ReMP is effective and efficient, and outperforms the state of the arts on various standard few-shot learning datasets.

Original languageEnglish
Title of host publicationProceedings - 2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2021
PublisherIEEE Computer Society
Pages2581-2590
Number of pages10
ISBN (Electronic)9781665448994
DOIs
StatePublished - Jun 2021
Event2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2021 - Virtual, Online
Duration: Jun 19 2021Jun 25 2021

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2021
CityVirtual, Online
Period06/19/2106/25/21

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