Abstract
A technique for testing the reliability performance of the thin dielectrics used in dielectric insulation was developed. Standard statistical techniques for life-testing were employed, along with several novel modifications, in the data analysis. It was found that the voltage dependence followed nearly that seen for intense corona dc and ac voltage applications, while the higher pulse repetition rate (rep-rate) permitted a greater pulse life than did lower rep-rates.
| Original language | English |
|---|---|
| Pages (from-to) | 218-228 |
| Number of pages | 11 |
| Journal | Conference Record of IEEE International Symposium on Electrical Insulation |
| Volume | 1 |
| State | Published - 1998 |
| Event | Proceedings of the 1998 IEEE International Symposium on Electrical Insulation. Part 1 (of 2) - Arlington, VA, USA Duration: Jun 7 1998 → Jun 10 1998 |
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