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Relation between phase stability and mechanical defects in InGa(Al)As/GaAs and ZnSe/GaAs heterostructures under pressure

  • T. M. Ritter
  • , B. A. Weinstein
  • , H. M. Kim
  • , C. R. Wie
  • , K. Stair
  • , C. Choi-Feng
  • , M. Funato
  • SUNY Buffalo
  • Amoco Technology Corp.
  • Kyoto University

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

We report pressure-Raman experiments on elastically metastable heterostructures from two systems: (i) InxY1 - xAs epilayers and InxY1 - xAs/GaAs multilayers (Y = Ga or Al; x ≅ 0.5) grown on GaAs or InP substrates; (ii) ZnSe epilayers and ZnSe/GaAs multilayers grown on GaAs. The LO(Γ) phonon frequencies are measured for pressure up to the α-β phase transitions in the various constituents. Several samples exhibit pressure-induced relaxation of the internal strain due either to formation of interface dislocations or to structural fluctuations antecedent to an α-β transition. Superpressing is observed for the InxAl1 - xAs α-β transition in the multilayers, but it is not apparent for the ZnSe transition in our samples. A correspondence between the formation of dislocations and the absence of superpressing is discussed.

Original languageEnglish
Pages (from-to)607-613
Number of pages7
JournalJournal of Physics and Chemistry of Solids
Volume56
Issue number3-4
DOIs
StatePublished - 1995

Keywords

  • A. semiconductors
  • B. epitaxial growth
  • C. high pressure
  • D. phase transitions
  • D. phonons

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