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Reduction of spin injection efficiency by interface defect spin scattering in ZnMnSe/AlGaAs-GaAs spin-polarized light-emitting diodes

  • R. M. Stroud
  • , A. T. Hanbicki
  • , Y. D. Park
  • , G. Kioseoglou
  • , A. G. Petukhov
  • , B. T. Jonker
  • , G. Itskos
  • , A. Petrou
  • Naval Research Laboratory
  • SUNY Buffalo

Research output: Contribution to journalArticlepeer-review

106 Scopus citations

Abstract

The effects of the interface microstructure on spin-injection efficiency in Zn1-xMnxSe/AlyGa1-yAs-GaAs spin-polarized light-emitting diodes (spin-LEDs) were studied. It was shown that the quantum well (QW) spin polarization correlates inversely with the density of linear defects resulting from stacking faults at the ZnMnSe/AlGaAs interface.

Original languageEnglish
Article number166602
Pages (from-to)166602/1-166602/4
JournalPhysical Review Letters
Volume89
Issue number16
DOIs
StatePublished - Oct 14 2002

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