Abstract
Metal-insulator-n** plus Si-p** plus Si solar cells, fabricated on Ga- and B-doped substrates, were compared for tolerance to 1. 0-MeV electron irradiation. Cells were tested by deep-level transient spectroscopy and current spectroscopic techniques prior to and after irradiation. Ga-doped substrates produced cells with superior tolerance to irradiation. After irradiation, B-doped cells gave defect levels more towards the upper half of the bandgap compared to Ga-doped cells, which showed levels toward the lower half. After irradiation, B-doped cells appear to be more susceptible to S-R-H recombination, whereas Ga-doped cells exhibit a multistep tunneling recombination. The latter results in a smaller reverse saturation current which better preserves V//o//c.
| Original language | English |
|---|---|
| Pages (from-to) | 644-649 |
| Number of pages | 6 |
| Journal | Conference Record of the IEEE Photovoltaic Specialists Conference |
| State | Published - 1987 |
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