Abstract
This paper presents a simulation model to predict the power generation of p-n junction-based betavoltaic devices. The model provides two key aspects of information for device evaluation: electron-hole pair generation rate and device power output. A Monte-Carlo model was used to simulate generation rate and the device performance was simulated using the generation rate with Synopsys® Medici. We investigated the effects of the temperature, semiconductor materials with different bandgap energies (Si, Ge and SiC) and different isotope sources (Ni-63 and tritium) on the performance of betavoltaic microbatteries. Our simulation results indicate that a homojunction structure with wide bandgap semiconductor is more favorable for betavoltaic device performance. A simple wide bandgap p-n junction cell with an embedded radioisotope source could be the most promising candidate for betavoltaic applications.
| Original language | English |
|---|---|
| Pages (from-to) | 131-137 |
| Number of pages | 7 |
| Journal | Sensors and Actuators A: Physical |
| Volume | 240 |
| DOIs | |
| State | Published - Apr 1 2016 |
Keywords
- Betavoltaic microbattery
- Electron-hole pair generation rate
- Monte Carlo simulation
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