Abstract
Polycrystalline silver supported pure and mixed mono- and multilayer films of eicosanoic [CH3(CH2)18COOH] and docosanoic [CH3(CH2)20COOH] acids have been prepared by the standard Langmuir-Blodgett technique. The emission of quasimoiecular ions as a function of ion dosage has been studied to infer information regarding secondary ion stability under ion bombardment. The results indicate molecular orientation and substrate dependence for (M + H)+ emission and the attenuation of (M + Ag)+ and (M — H + 2Ag)+ with increased film thickness. Data are presented for studies conducted on both quadrupole mass filter and time-of-flight instrumentation. The effects of supporting substrate morphology, instrumentation, and implications for quantification of molecular static-secondary ion mass spectrometry (static-SIMS) ion emission are discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 2283-2286 |
| Number of pages | 4 |
| Journal | Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films |
| Volume | 8 |
| Issue number | 3 |
| DOIs | |
| State | Published - May 1990 |
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